In-situ Electrode Manipulation for Three Terminal Field Emission Characterisation of Individual Carbon Nanotubes

In-situ three terminal electron field emission characterisation of an isolated multiwalled carbon nanotube has been performed. Both anode and gate electrodes are attached to high precision piezo-drivers allowing for the characterisation of single emitters. All measurements are performed in a scanning electron microscope allowing accurate knowledge of the local environment of the nanotube to be obtained. We show that the presence of the grounded gate electrode screens the applied field by approximately 32%. This technique in positioning the gate and anode electrodes also allows for estimates of the gate transparency factor and demonstrates characterisation of individual carbon nanotubes without the need for fabrication of arrays of emitters.